Measurement of the Thermal Conductivity of Carbon Nanowalls by the 3ω Method

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Carbon nanowall films with different thicknesses have been obtained by chemical deposition from a gas phase in a dc discharge. The thermal conductivity of the resulting structures has been measured for the first time using the 3ω method in the temperature range of 280–310 K. It has been shown that the thermal conductivity of walls depends on their thickness. The thermal conductivity of 1-μm carbon nanowalls is 6.9 W m–1 K–1. The results obtained in this work are necessary to design electro-optical devices based on carbon nanowalls.

作者简介

D. Chernodubov

National Research Center Kurchatov Institute

Email: dgkvashnin@phystech.edu
123182, Moscow, Russia

Yu. Bondareva

Skolkovo Institute of Science and Technology

Email: dgkvashnin@phystech.edu
121205, Moscow, Russia

M. Shibalov

Institute of Nanotechnologies of Microelectronics, Russian Academy of Sciences

Email: dgkvashnin@phystech.edu
119991, Moscow, Russia

A. Mumlyakov

Institute of Nanotechnologies of Microelectronics, Russian Academy of Sciences

Email: dgkvashnin@phystech.edu
119991, Moscow, Russia

V. Zhdanov

National Research University Higher School of Economics

Email: dgkvashnin@phystech.edu
101000, Moscow, Russia

M. Tarkhov

Institute of Nanotechnologies of Microelectronics, Russian Academy of Sciences

Email: dgkvashnin@phystech.edu
101000, Moscow, Russia

K. Maslakov

Moscow State University

Email: dgkvashnin@phystech.edu
119991, Moscow, Russia

N. Suetin

Skobeltsyn Institute of Nuclear Physics, Moscow State University

Email: dgkvashnin@phystech.edu
119991, Moscow, Russia

D. Kvashnin

Emanuel Institute of Biochemical Physics, Russian Academy of Sciences; Pirogov Russian National Research Medical University

编辑信件的主要联系方式.
Email: dgkvashnin@phystech.edu
119334, Moscow, Russia; 117997, Moscow, Russia

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