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Mikroèlektronika
ISSN 0544-1269 (Print)
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Keywords Förster effect bipolar transistor charge qubit dissociation etching fluorocarbon gases gas temperature ionization kinetics mechanism memristor modeling molecular beam epitaxy plasma polymerization quantum dot radiation intensity reduced electric field strength resistive switching silicon specific power
Current Issue Cover Page

Vol 53, No 6 (2024)

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Keywords Förster effect bipolar transistor charge qubit dissociation etching fluorocarbon gases gas temperature ionization kinetics mechanism memristor modeling molecular beam epitaxy plasma polymerization quantum dot radiation intensity reduced electric field strength resistive switching silicon specific power
Current Issue Cover Page

Vol 53, No 6 (2024)

Home > Search > Author Details

Author Details

Kodorova, I. Yu.

Issue Section Title File
Vol 53, No 3 (2024) МОДЕЛИРОВАНИЕ Thermal modelling and layout optimization of GaN half-bridge IC with integrated drivers and power HEMTs
 

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