Mikroèlektronika
ISSN 0544-1269 (Print)
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Keywords
Förster effect
bipolar transistor
charge qubit
dissociation
etching
fluorocarbon gases
gas temperature
ionization
kinetics
mechanism
memristor
modeling
molecular beam epitaxy
plasma
polymerization
quantum dot
radiation intensity
reduced electric field strength
resistive switching
silicon
specific power
Current Issue
Vol 53, No 6 (2024)
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Keywords
Förster effect
bipolar transistor
charge qubit
dissociation
etching
fluorocarbon gases
gas temperature
ionization
kinetics
mechanism
memristor
modeling
molecular beam epitaxy
plasma
polymerization
quantum dot
radiation intensity
reduced electric field strength
resistive switching
silicon
specific power
Current Issue
Vol 53, No 6 (2024)
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Kodorova, I. Yu.
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Vol 53, No 3 (2024)
МОДЕЛИРОВАНИЕ
Thermal modelling and layout optimization of GaN half-bridge IC with integrated drivers and power HEMTs
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