User

Username
Password
Remember me
Forgot password?	Register

Notifications

• View
• Subscribe

Search

Search

Search Scope All Authors Title Abstract Index terms Full Text

Browse

• By Issue
• By Author
• By Title
• By Sections
• Other Journals
• Categories

Information

• For Readers
• For Authors
• For Librarians

Subscription Login to verify subscription

Keywords Förster effect bipolar transistor charge qubit dissociation etching fluorocarbon gases gas temperature ionization kinetics mechanism memristor modeling molecular beam epitaxy plasma polymerization quantum dot radiation intensity reduced electric field strength resistive switching silicon specific power

Current Issue

Vol 53, No 6 (2024)